Low power logic BIST with high test effectiveness
نویسندگان
چکیده
منابع مشابه
Test Pattern Generator ( TPG ) for Low Power Logic Built In Self Test ( BIST ) Sabir Hussain
This research article proposed a logic BIST using linear feedback shift register (LFSR) to generate low power test patterns; It reduced the number of transitions at the input of the circuit-under-test using bit swapping technique. The designed architecture is programmed using Verilog HDL and simulated using CADENCE EDA Tool of 180 nm technology and also proposed design gives better performance ...
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and difficult aspects of the circuit design cycle, driving the need for innovative solutions. To this end, researchers have proposed built-in self-test (BIST) as a powerful DFT technique for addressing highly complex VLSI testing problems. BIST designs include on-chip circuitry to provide test patterns and analyze output responses. Performing tests on the chip greatly reduces the need for compl...
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A Low Transition LFSR(LT-LFSR) designed by modifying Linear Feedback Shift Register is proposed to produce low power test vectors which are given to Circuit under Test (CUT) to reduce the power consumption by CUT. This technique of generating low power test patterns is performed by increasing the co-relativity between the consecutive vectors by reducing the number of bit flips between successiv...
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This paper presents a logic BIST approach which combines deterministic logic BIST with test point insertion. Test points are inserted to obtain a first testability improvement, and next a deterministic pattern generator is added to increase the fault efficiency up to 100%. The silicon cell area for the combined approach is smaller than for approaches that apply a deterministic pattern generator...
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Low Power consumption has become growing larger for communication systems and battery operated devices. These are laptop computers, multimedia products, and cell phones. For this battery operated devices, the energy consumption is a critical issue for design since it affect the batteries life. Thereby, the reduction of the energy consumption is become one of the most growing topics in the elect...
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ژورنال
عنوان ژورنال: IEICE Electronics Express
سال: 2013
ISSN: 1349-2543
DOI: 10.1587/elex.10.20130853